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Atomic Force Microscopy Scanning Tunneling Microscopy 3

:	Samuel H. Cohen et al. (Eds.)
:	Atomic Force Microscopy Scanning Tunneling Microscopy 3
:	Kluwer Academic Publishers
:	9780306470950
:	1
:	CHF 126.10
:

:	Naturwissenschaft
:	English

:	218
:	DRM
:	PC/MAC/eReader/Tablet
:	PDF

The editors have done a fine job assembling a variety of contributions of varied style, topics, and current relevance into a coherent whole. The quality of the images, typesetting are all excellent and the book is organized in a thoughtful way.

APPLICATIONS OF SCANNING PROBE MICROSCOPY IN MATERIALS SCIENCE: EXAMPLES OF SURFACE MODIFICATION AND QUANTITATIVE ANALYSIS (p. 11-12)

Peter von Blanckenhagen
Forschungszentrum Karlsruhe
Institut für Nanotechnologie
Postfach 3640, D-76021
Karlsruhe, Germany

Abstract. An overview is presented of some applications of scanning tunneling and scanning force microscopy, which indicate capabilities to research and development in nanotechnology. Results are reported of studies of surface modifications by local material deposition (A1, Au) and by mechanical material removal (Au), and of studies of surface selfdiffusion (Au), cluster dynamics (Au), thermal stability of semiconducting quantum dots (In5A15Ga), metallic multilayers (Fe/Mo), nanocrystalline materials (Au), Al-island formation on Si (1 1 1) surfaces and, finally, of cluster size distribution as well as distance dependence of tip-sample interactions for A12O3 and Fe2O3 clusters.

INTRODUCTION

In recent years, scanning probe microscopy (SPM) has become an important tool in materials science. It not only allows ultimate analyses of surface structures to be conducted, but also unique procedures to be performed, such as material deposition, initiation of chemical reactions (e.g. oxidation, lithographic reactions), mechanical structuring as well as manipulation of atoms, molecules, and clusters.1,2 Phenomena of practical importance, such as friction,3,4 adhesion5, local magnetism,6,7and surface diffusion8 can be studied on a microscopic scale. Several special types of instruments are now available for surface modification and for studying the surface properties of materials.9,10,11 Among other methods of interest in materials science are electrolytic SPM techniques,12 and SPM techniques using magnetic13 and optical14 sensors.

Descriptions of surface topography were the main objective of earlier studies of scanning probe microscopy. In the past few years, however, more and more quantitative analyses have been performed by means of scanning probe microscopes.

In this overview, results will be discussed of nine cases of surface modification and quantitative analysis by scanning tunneling (STM) and scanning force microscopes (SFM, AFM). SPM has a considerable impact now on research and development in micro- and nanotechnology. Scanning force microscopes have become important tools for controlling the topography of electronic chips in the production process, and for analysis of the topography of micromechanical components. One of the most promising applications of scanning probe microscopy is in the elucidation of the fundamentals of future nanotechnology. In nanotechnology, materials science and solid state physics on an atomic scale should meet. Also studies of chemical and biological nanosystems will contribute to the fundamentals of future nanotechnology. Two aspects are of special interest: Firstly, the self-organization processes occurring in nature and secondly, the creation of nanosystems by surface modification and by manipulation of atoms, molecules or clusters, and the characterization of such artificial systems. It is worthwhile studying biological molecular systems, such as motors, sieves, and electrical conductors, to find ways of designing nanosystems for practical use. A review is presented below of the findings made in various subjects of potential interest in nanotechnology, which were studied at our laboratory over the past few years by scanning tunneling and scanning force microscopy.

MATERIALS AND METHODS

Local material deposition was performed with the UHV-STM supplied by Perkin-Elmer, which is operated by a Nanoscope III controller. The silicon surfaces were cleaned by flashing samples to 1250° C by direct current heating. The tunneling tips were produced by mechanical cutting in air of Au or A1 wires 0.25 mm thick. The materials used for SFM studies in air must be stable in air. In most cases, Au samples were used for exploratory studies to minimize the influence of the atmosphere. The samples were examined under a commercial atomic force microscope (Multimode SPM with Nanoscope IIIA controller) in the contact mode or the tapping mode of operation. In some cases, the chemical composition of surfaces was analyzed by Auger electron spectroscopy (AES).

	PREFACE	5
	CONTENTS	7
	A PRACTICAL APPROACH TO UNDERSTANDING SURFACE METROLOGY AND ITS APPLICATIONS	9
	INTRODUCTION	9
	SCALES OF INTERACTION – GENERAL AND FUNDAMENTAL	10
	SCALES OF INTERACTION IN MEASUREMENT	11
	SCALES OF INTERACTION IN CONVENTIONAL ANALYSIS	12
	SCALE- SENSITIVE GEOMETRIC PROPERTIES AND FRACTAL ANALYSIS	14
	THE SELECTION OF ANALYSISMETHODS AND CHARACTERIZATION PARAMETERS	15
	INFORMATION CONTENT	16
	CONCLUDING REMARKS	17
	Acknowledgments	17
	REFERENCES	17
	APPLICATIONS OF SCANNING PROBE MICROSCOPY IN MATERIALS SCIENCE: EXAMPLES OF SURFACE MODIFICATION AND QUANTITATIVE ANALYSIS	19
	INTRODUCTION	19
	MATERIALS AND METHODS	20
	EXAMPLES OF MODIFICATION AND STRUCTURING OF SUFACES	20
	EXAMPLES OF QUANTITATIVE ANALYSES OF SURFACE TOPOGRAPHY	22
	DISCUSSION: PROBLEMS AND PERSPECTIVES	35
	Acknowledgments	35
	REFERENCES	36
	SCANNING PROBE MICROSCOPY IN BIOLOGY WITH POTENTIAL APPLICATIONS IN FORENSICS	38
	INTRODUCTION	38
	PROBES	39
	ARTIFACTS AND RESOLUTION	40
	Other Nucleo-Protein Systems	45
	SUMMARY	53
	Acknowledgments	53
	REFERENCES	54
	ATOMIC MANIPULATION OF HYDROGEN ON HYDROGEN-TERMINATED SILICON SURFACES WITH SCANNING TUNNELING MICROSCOPE	56
	INTRODUCTION	56
	MATERIALS AND METHODS	57
	Si( 100)- 2 x 1 Surface Preparation	57
	Hydrogen- Terminated Silicon Surfaces	58
	RESULTS AND DISCUSSIONS Hydrogen Extraction from the Si( 100)- 2 x 1: H Surface	60
	Hydrogen Deposition onto the Si( 100)- 2 x 1: H Surface	65
	CONCLUSIONS	68
	ACKNOWLEDGMENTS	69
	REFERENCES	70
	APOLLO 11 LUNAR SAMPLES: AN EXAMINATION USING TAPPING MODE ATOMIC FORCE MICROSCOPY AND OTHER MICROSCOPIC METHODS	72
	INTRODUCTION	72
	MATERIALS AND METHODS	73
	RESULTS AND DISCUSSION	74
	CONCLUSION	76
	REFERENCE	80
	NOVEL MICROMACHINED CANTILEVER SENSORS FOR SCANNING NEAR-FIELD MICROSCOPY	81
	INTRODUCTION	81
	NEAR-FIELD SENSOR TECHNOLOGY	82
	EXPERIMENTAL SET-UP	83
	RESULTS	85
	CONCLUSION	87
	Acknowledgment	87
	REFERENCES	87
	IMAGING OF CELL SURFACE STRUCTURE BY SCANNING PROBE MICROSCOPY	88
	INTRODUCTION AND EXPERIMENTAL	88
	RESULTS AND DISCUSSION	89
	CONCLUSION	91
	REFERENCES	91
	A FORCE LIMITATION FOR SUCCESSFUL OBSERVATION OF ATOMIC DEFECTS: DEFECT TRAPPING OF THE ATOMIC FORCE MICROSCOPY TIP	92
	INTRODUCTION	92
	Model for the Simulations	93
	RESULTS AND DISCUSSION	95
	CONCLUSIONS	99
	REFERENCES	99
	A NEW APPROACH TO EXAMINE INTERFACIAL INTERACTION POTENTIAL BETWEEN A THIN SOLID FILM OR A DROPLET AND A SMOOTH SUBSTRATE	101
	INTRODUCTION	101
	EXPERIMENTAL	102
	RESULTS AND DISCUSSION	103
	I. Sublimation Rate ofMicron-Sized TNT on Silica Surface Ia. Tapping Mode AFM Study of a Thin Solid TNT Film on a Silica Surface	104
	Ib. Model Consideration	106
	11. Evaporation of TNT Liquid Droplets on Silica Surface	110
	IIa. AFM Images Of Explosive Droplets On Silica Surfaces	111
	IIb. A Model Consideration	113
	CONCLUSION	115
	ACKNOWLEDGMENTS	115
	REFERENCES	115
	NANOMETER-SCALE PATTERNING OF SURFACES USING SELF-ASSEMBLY CHEMISTRY. 1. PRELIMINARY STUDIES OF POLYANILINE ELECTRODEPOSITION ON SELF-ASSEMBLED MIXED MONOLAYERS	116
	INTRODUCTION	116
	EXPERIMENTAL	117
	RESULTS AND DISCUSSION	118
	CONCLUSION	122
	Acknowledgment	122
	REFERENCES	122
	LOCAL RATE OF ELECTROLESS COPPER DEPOSITION BY SCANNING TUNNELING MICROSCOPY	124
	INTRODUCTION	124
	EXPERIMENTAL	125
	RESULTS	126
	Acknowledgments	126
	REFERENCES	126
	ATOMIC FORCE MICROSCOPY OF OLIVINE	127
	INTRODUCTION	127
	MATERIALS AND METHODS	128
	RESULTS AND DISCUSSION	129
	SUMMARY	134
	Acknowledgments	136
	REFERENCES	136
	THE STUDY OF SUBLIMATION RATES AND NUCLEATION AND GROWTH OF TNT AND PETN ON SILICA AND GRAPHITE SURFACES BY OPTICAL AND ATOMIC FORCE MICROSCOPY AND ELLIPSOMETRY	137
	INTRODUCTION	138
	EXPERIMENTAL	139