| Advanced Materials for Thermal Management of Electronic Packaging | 3 |
|---|
| Preface | 7 |
| Contents | 9 |
| Abbreviations | 17 |
| Chapter 1: Thermal Management Fundamentals and Design Guides in Electronic Packaging | 23 |
| Rationale of Thermal Management | 23 |
| Heat Sources and Thermal Effects on Integrated Circuit Operation | 25 |
| Power Density | 25 |
| Joule Heating | 26 |
| Thermal Failure Induced by Different Coefficient of Thermal Expansions | 27 |
| Thermal Failure Rates | 28 |
| Thermal Management Challenges and Common Concerns | 28 |
| Overall Picture of Thermal Management in Different Packaging Levels | 31 |
| Chip Level Packaging Thermal Management | 33 |
| Board Level Packaging Thermal Management | 34 |
| System-Level Packaging Thermal Management | 37 |
| Thermal Management Solutions | 38 |
| Hardware Solutions | 39 |
| Software Solutions and Software-Based Dynamic Thermal Management | 44 |
| Optimal Thermal Design of a Package | 47 |
| Fundamentals of Heat Transfer and Thermal Calculation in Electronic Packaging | 49 |
| Conduction | 50 |
| Convection | 53 |
| Radiation | 54 |
| Multimode Heat Transfer in Electronic Packaging | 56 |
| Microscale Heat Transfer | 58 |
| Design for Advanced Thermal Management of Electronic Packaging | 60 |
| Thermal Design Guidelines | 61 |
| Thermal Modeling and Simulation | 63 |
| Principles of Thermal Modeling | 64 |
| General Approaches | 65 |
| Example Methods for Thermal Modeling of Electronic Packaging | 66 |
| Chip Modeling | 67 |
| Substrate Modeling | 67 |
| Interfaces | 68 |
| Experimental Verification | 68 |
| Materials Selection for Advanced Thermal Management | 69 |
| Interface Joining Materials | 70 |
| Bulk Materials for Heat Spreading and Dissipating | 71 |
| Materials and Components Integration | 72 |
| Higher Conductivity Materials | 72 |
| Increasing Wetting or Bonding Forces | 73 |
| Decreasing Interface Thickness | 73 |
| Elimination of the Number of Interfaces | 73 |
| Environmental Compliance of Thermal Management Materials | 74 |
| RoHS | 75 |
| WEEE | 76 |
| Summary | 77 |
| References | 79 |
| Chapter 2: Characterization Methodologies of Thermal Management Materials | 81 |
| Thermal Properties and Measurement Techniques | 81 |
| Thermal Conductivity and Diffusivity | 81 |
| Axial Flow Methods | 85 |
| Absolute Axial Heat Flow | 85 |
| Comparative Cut Bar (ASTM E1225 Test Method) | 85 |
| Guarded or Unguarded Heat Flow Meter Method (ASTM C518, E1530 Test Methods) | 86 |
| Guarded Hot Plate Method (ASTM C 177 Test Method) | 86 |
| Hot Wire Method (ASTM C1113 Test Method) | 87 |
| Laser Flash Method | 88 |
| Coefficient of Thermal Expansion | 90 |
| Specific Heat Capacity | 91 |
| Thermal Shock Resistance | 92 |
| Thermal Characterization of Micro/Nanomaterials | 94 |
| The 3omega Method | 95 |
| 2-D Thin Films | 95 |
| 1-D Nanomaterials | 99 |
| Thermoreflectance Approach | 99 |
| Electrical Properties and Measurement Techniques | 102 |
| Electrical Conductivity and Resistivity | 102 |
| Eddy Current Testing | 103 |
| Two-Point Technique | 103 |
| Four-Point Technique | 104 |
| Van der Pauw Technique | 104 |
| Permittivity and Its Characterization | 105 |
| Thermomechanical Characterization | 106 |
| Characterization Techniques of Thermally Induced Stress and Strain | 107 |
| Micromechanical Tester | 108 |
| Moiré Interferometry | 109 |
| Speckle Techniques | 111 |
| Fundamental Equations of Deformable Bodies | 112 |
| Constitutive Behavior | 113 |
| Thermomechanical Analysis | 116 |
| Plain Stress and Plain Strain | 117 |
| Beams and Laminate Assemblies | 117 |
| Bimaterial Assembly | 118 |
| Trimaterial Assembly | 121 |
| Numerical Method | 121 |
| Thermomechanical Failures | 122 |
| Static Failure | 123 |
| Failure of Fracture Mechanics | 123 |
| Fatigue Failure | 124 |
| Analytical Techniques for Materials Characterization | 126 |
| Optical Microscopy | 126 |
| X-Ray Diffraction | 128 |
| Single-Crystal Method | 129 |
| Scanning Electron Microscopy | 131 |
| Transmission Electron Microscopy | 132 |
| Scanning Acoustic Microscopy | 134 |
| Atomic Force Microscopy | 136 |
| Contact Mode | 137 |
| Lateral Force Microscopy | 137 |
| Noncontact Mode | 137 |
| Dynamic Force/Intermittant-Contact/``Tapping Mode´´ AFM | 137 |
| Force Modulation | 138 |
| Phase Imaging | 138 |
| Surface Finish Requirement and Contact Interface Compatibility | 139 |
| Corrosion and Oxidation Protection | 139 |
| Noble Finish Selection | 139 |
| Gold (Au) | 140 |
| Palladium (Pd) | 140 |
| Noble Metal Alloys | 140 |
| Nonnoble Finishes | 141 |
| Tin (Sn) | 141 |
| Silver (Ag) | 142 |
| Ni
|