ebook ebooks e-book e-books downloaden bei MyEbooks.ch downloaden

Electron Backscatter Diffraction in Materials Science

$Electron Backscatter Diffraction in Materials Science$

:	Adam J. Schwartz, Mukul Kumar, David P. Field, Brent L. Adams
:	Adam J. Schwartz, Mukul Kumar, Brent L. Adams, David P. Field
:	Electron Backscatter Diffraction in Materials Science
:	Springer-Verlag
:	9780387881362
:	2
:	CHF 255.60
:

:	Maschinenbau, Fertigungstechnik
:	English

:	403
:	Wasserzeichen/DRM
:	PC/MAC/eReader/Tablet
:	PDF

Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter diffraction to a wide-range of materials including undeformed and deformed metals and alloys, ceramics, and superconductors.

The text has been substantially revised from the first edition, and the authors have kept the format as close as possible to the first edition text. The new developments covered in this book include a more comphrensive coverage of the fundamentals not covered in the first edition or other books in the field, the advances in hardware and software since the first edition was published, and current examples of application of electron backscatter diffraction to solve challenging problems in materials science and condensed-matter physics.

Adam J. Schwartz is the Deputy Division Leader for Condensed Matter and High Pressure Physics in the Physics and Advanced Technologies Directorate. Dr. Schwartz joined LLNL as a post-doctoral research associate to investigate the systematics of displacive phase transformations after receiving his PhD from the University of Pittsburgh in 1991. His areas of interests focus on structure-propoerty-processin relations, aging and phase transformations in actinides; influence of microstructure and impurities on high-strain rate deformation behavior, texture and texture gradients in materials, intercrystalline defects and the role of grain boundary character distribution in materials, conventional and high resolution transmission electron microscopy, and electron backscatter diffraction. Dr. Schwartz has authored over 50 publications and has one patent.

Mukul Kumar joined as a staff scientist in the Materials Science and Technology Division in 1998 after completing a stint as a post-doctoral fellow at Johns Hopkins University. Prior to that, he received his PhD from the University of Cincinnati, where he was an Oak Ridge Institute for Science and Engineering Fellow and also received the ASM International Arthur Focke Award for his dissertation work. His areas of interest include the relationship between properties and microstructures, particularly as related to extreme environments encountered in turbine jet engine and nuclear reactor environments and high strain rate and pressure conditions; defect analysis using conventional transmission electron microscopy; and electron backscatter diffraction. Kumar has authored over 70 publications and has two patents.

	Contents	5
	Contributors	14
	1 Present State of Electron Backscatter Diffraction and Prospective Developments	22
	1.1 Introduction	22
	1.2 Generation and Interpretation of Electron Backscatter Diffraction Patterns	23
	1.3 Experimental Set-Up of an EBSD System	24
	1.4 The Components of an Automated EBSD System	25
	1.4.1 The Pattern Acquisition Device	25
	1.4.2 Mechanical Stage and Digital Beam Scanning	26
	1.5 Spatial Resolution	28
	1.6 SEM Specifications for Good EBSD Performance	30
	1.7 The Radon or Hough Transformation for Band Localization	31
	1.8 Indexing indexing	33
	1.9 Fast EBSD Fast EBSD	34
	1.10 Ion Blocking Patterns	36
	1.11 Conclusions	40
	References	40
	2 Dynamical Simulation of Electron Backscatter Diffraction Patterns	42
	2.1 Introduction	42
	2.2 Model of Electron Backscatter Diffraction	42
	2.3 Dynamical Electron Diffraction in EBSD	43
	2.3.1 Using the Reciprocity Principle	43
	2.3.2 Bloch Wave Formalism	44
	2.3.3 Inclusion of the Backscattering Process	45
	2.4 Applications	46
	2.4.1 A Real-Space View of EBSD	46
	2.4.2 Full Scale Simulation of EBSD Patterns	48
	2.4.3 The Influence of the Energy Spectrum of the Backscattered Electrons	49
	2.4.4 Dynamical Effects of Anisotropic Backscattering	51
	2.5 Summary	53
	References	53
	3 Representations of Texture	55
	3.1 Introduction	55
	3.2 Rotations and Orientations	56
	3.2.1 Defining a Rotation	56
	3.2.2 Defining an Orientation	57
	3.3 Pole Figures	58
	3.4 Discrete Orientations	60
	3.4.1 Axis-Angle Parameters	61
	3.4.2 Rodrigues Vectors	62
	3.4.3 Quaternions	62
	3.4.4 Euler Angles	65
	3.5 Orientation Distribution Functions	66
	3.5.1 Circular Harmonics	66
	3.5.2 Spherical Harmonics	67
	3.5.3 Hyperspherical Harmonics	68
	3.5.4 Generalized Spherical Harmonics	69
	3.5.5 Symmetrized Harmonics	69
	3.6 Conclusion	70
	References	71
	4 Energy Filtering in EBSD	72
	4.1 Introduction	72
	4.2 Background	72
	4.3 Energy Filters	73
	4.4 Operating the Filter	75
	4.5 Early Results	76
	4.6 Patterns at Different Energies	79
	4.7 Localization of the Signal	80
	4.8 Future Energy Filters in EBSD	81
	4.9 Summary and Conclusions	81
	References	82
	5 Spherical Kikuchi Maps and Other Rarities	83
	5.1 Introduction	83
	5.2 Electron Backscatter Patterns	83
	5.3 Spherical Kikuchi Maps	83
	5.4 EBSP Detectors	83
	5.5 EBSP Imaging and Uniformity	86
	5.6 EBSP Simulation	86
	5.7 Spherical Kikuchi Maps from EBSPs	86
	5.8 Kikuchi Band Profiles	90
	5.9 Spherical Kikuchi Map Inversion	92
	5.10 Uses for Spherical Kikuchi Maps	93
	5.11 Colour Orientation Contrast Images	94
	5.12 STEM in the SEM	94
	5.13 Unusual Features in EBSPs	95
	References	97
	6 Application of Electron Backscatter Diffraction to Phase Identification	99
	6.1 Introduction	99
	6.2 Considerations for Phase ID with EBSD	100
	6.3 Case Studies	102
	6.3.1 Simultaneous EBSD/EDS Phase Discrimination	103
	6.3.2 Distinguishing ' and '' in Ni Superalloys	104
	6.3.3 Volume Fraction Determination in a Multiphase Alloy	107
	References	112
	7 Phase Identification Through Symmetry Determination in EBSD Patterns	114
	7.1 Introduction	114
	7.2 Basis of the Phase Identification Method	114
	7.3 Determination of the Crystal Unit Cell	115
	7.4 Discovering the Lattice Symmetry	117
	7.5 Re-Indexing the Pattern According to the Discovered Crystal Class	118
	7.6 Examples	119
	7.6.1 Case 1, A Cubic Crystal	119
	7.6.2 Case 2, A Hexagonal Crystal	121
	7.6.3 Case 3, A Trigonal Crystal	121
	7.7 Discussion	123
	References	124
	8 Three-Dimensional Orientation Microscopy by Serial Sectioning and EBSD-Based Orientation Mappingin a FIB-SEM	125
	8.1 Introduction	125
	8.2 The Geometrical Set-Up for 3D Characterisation in a FIB-SEM	126
	8.3 Automatic 3D Orientation Microscopy	129
	8.4 Software for 3D Data Analysis	129
	8.5 Application Examples	130
	8