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Intense Electron and Ion Beams

:	Sergey Ivanovich Molokovsky, Aleksandr Danilovich Sushkov
:	Intense Electron and Ion Beams
:	Springer-Verlag
:	9783540288121
:	1
:	CHF 85.60
:

:	Atomphysik, Kernphysik
:	English

:	281
:	Wasserzeichen/DRM
:	PC/MAC/eReader/Tablet
:	PDF

Intens Ion and Electron Beams treats intense charged-particle beams used in vacuum tubes, particle beam technology and experimental installations such as free electron lasers and accelerators. It addresses, among other things, the physics and basic theory of intense charged-particle beams; computation and design of charged-particle guns and focusing systems; multiple-beam charged-particle systems; and experimental methods for investigating intense particle beams. The coverage is carefully balanced between the physics of intense charged-particle beams and the design of optical systems for their formation and focusing. It can be recommended to all scientists studying or applying vacuum electronics and charged-particle beam technology, including students, engineers, and researchers.

	Preface	5
	Contents	7
	1 Introduction to Particle-Beam Formation	13
	1.1 Application and Parameters of Intense Charged- Particle Beams	13
	1.2 Optical Systems of Electron Devices	16
	1.3 Focusing System of Electron Devices	21
	1.4 Optical Systems of Particle-Beam Technology	26
	1.5 Ion Optical Systems	28
	2 Methods of Fields Calculation	30
	2.1 General Equations of Electrostatic Fields	30
	2.2 Electrostatic Field Calculation. Dirichlet Problem	31
	2.3 Calculation of Electrostatic Field: Cauchy Problem	41
	2.4 Computer Calculation of Electrostatic Fields	47
	2.5 General Equations of Magnetic Field	54
	2.6 Numerical Calculation of Magnetic Field	58
	3 Fundamentals of Charged-Particle Motion	65
	3.1 Equations of Motion in Newton Form	65
	3.2 Law of Energy Conservation	66
	3.3 Lagrange Equations of Motion	68
	3.4 Hamilton Equations	69
	3.5 Hamilton Jacobi Equation	70
	3.6 Equations of Motion in Axially Symmetric Fields	72
	3.7 Motion in Planar Two-Dimensional Fields	83
	3.8 Numerical Calculation of Charged- Particle Trajectories	84
	3.9 Electrostatic Charged-Particle Lenses	87
	3.10 Magnetic Lenses	96
	4 Motion of Intense Charged-Particle Beams	105
	4.1 Peculiarities of Intense Particle-Beam Motion	105
	4.2 Simplified Models of Charged-Particle Beams	108
	4.3 Methods of Solution of Motion Equations	112
	4.4 Approximate Method of Space-Charge Account	115
	4.5 Motion of Charge-Beams in Channels Free from External Fields	117
	4.6 Influence of Residual Gases on Electron- Beam Motion	120
	4.7 Estimation of Effect of Thermal Electron Velocities	127
	4.8 Methods of Solution of Self-Consistent Problems	131
	5 Electron Guns	134
	5.1 The Problem of Electron-Beam Formation	134
	5.2 Guns for Formation of Strip Beams	135
	5.3 Guns for Solid Axially Symmetric Beams	142
	5.4 Guns for Formation of Hollow Axisymmetric Beams	150
	5.5 Electron Guns with Beam-Current Control	154
	5.6 Principle of Computer-Aided Design of Electron Guns	160
	6 Electron and Ion Sources with Field and Plasma Emitters	165
	6.1 Some Peculiarities of Field and Plasma Emitters	165
	6.2 Low-Current Field-Emission Guns	165
	6.3 Multiple-Tip Field-Emission Cathodes	167
	6.4 High-Current Electron Sources with Explosive Emission	168
	6.5 Liquid-Metal Emitters	168
	6.6 Plasma Sources of Charged Particles	169
	6.7 Extracting of Charge Particles and Beam Forming	173
	7 Magnetic Focusing Systems	176
	7.1 Focusing Systems with Uniform Field	176
	7.2 Systems of Reversed- and Periodic-Field Focusing	188
	7.3 Focusing of Hollow Beams in Uniform Field	195
	7.4 Focusing of Strip Beams	200
	7.5 Computer-Aided Design of Magnetic Systems	203
	8 Electrostatic Focusing Systems	205
	8.1 Focusing System for Solid Axially Symmetrical Beams	205
	8.2 Systems for Focusing of Strip Beams	216
	8.3 Focusing Systems for Hollow Beams	217
	9 Optical Systems of Technological Installations	220
	9.1 Electron Probe of Welding Installation	220
	9.2 Optical System for Electron-Beam Lithography	224
	9.3 Ion Probes	226
	10 Intense Relativistic Charged- Particle Beams	228
	10.1 Relativistic Equations of Motion	228
	10.2 Intense Relativistic Beams in Vacuum Channels	230
	10.3 Neutralized Relativistic Beams	237
	10.4 Beam-Motion Computation	237
	11 Multiple-Beam Electron-Optical Systems	242
	11.1 Peculiarities and Application of Multiple Beams	242
	11.2 Multiple-Beam Guns and Magnetic Systems	244
	11.3 Peculiarities of Multiple Systems	248
	11.4 Estimation of Effects of Transverse Fields	253
	11.5 Analysis of Beam Interaction	255
	12 Methods of Experimental Investigation of Beams	260
	12.1 Classification of Methods	260
	12.2 The Pin-Hole Chamber Method	263
	12.3 Application of Modified Pin-Hole Chamber	266
	Appendix	270
	Emittance and Brightness	270
	References	274
	Index	283