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1-3 3
Power-Aware Testing and Test Strategies for Low Power Devices Power-Aware Testing and Test Strategies for Low Power Devices
: Patrick Girard, Nicola Nicolici, Xiaoqing Wen   
: 9781441909282   
: Springer-Verlag   
: eBook   

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CHF 96.70     Download
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
: Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel   
: 9781441909381   
: Springer-Verlag   
: eBook   

: Wasserzeichen   
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Dynamic Formal Epistemology Dynamic Formal Epistemology
: Mathieu Marion, Olivier Roy, Patrick Girard   
: 9789400700741   
: Springer-Verlag   
: eBook   

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: PC/MAC/eReader/Tablet   
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CHF 87.10     Download