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Precision Landmark Location for Machine Vision and Photogrammetry Finding and Achieving the Maximum Possible Accuracy Precision Landmark Location for Machine Vision and Photogrammetry Finding and Achieving the Maximum Possible Accuracy
: José A. Gutierrez, Brian S.R. Armstrong   
: 9781846289132   
: Springer-Verlag   
: eBook   

: Wasserzeichen   
: PC/MAC/eReader/Tablet   
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